IEC 60749-13 Ed. 2.0 b:2018 PDF

IEC 60749-13 Ed. 2.0 b:2018 PDF

Name:
IEC 60749-13 Ed. 2.0 b:2018 PDF

Published Date:
02/15/2018

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$28.5
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IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).
Edition : 2.0
File Size : 1 file , 1 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 28
Published : 02/15/2018

History

IEC 60749-13 Ed. 2.0 b:2018
Published Date: 02/15/2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
$28.5
IEC 60749-13 Ed. 1.0 b CORR1:2003
Published Date: 08/13/2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
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