IEC 60749-23 Amd.1 Ed. 1.0 b:2011 PDF

IEC 60749-23 Amd.1 Ed. 1.0 b:2011 PDF

Name:
IEC 60749-23 Amd.1 Ed. 1.0 b:2011 PDF

Published Date:
01/27/2011

Status:
Active

Description:

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$3.9
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Edition : 1.0
File Size : 1 file , 260 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 5
Published : 01/27/2011

History


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