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IEC 60749-29 Ed. 2.0 b:2011 PDF

IEC 60749-29 Ed. 2.0 b:2011 PDF

Name:
IEC 60749-29 Ed. 2.0 b:2011 PDF

Published Date:
04/07/2011

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$57
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IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.
Edition : 2.0
File Size : 1 file , 680 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 48
Published : 04/07/2011

History

IEC 60749-29 Ed. 2.0 b:2011
IEC 60749-29 Ed. 2.0 b:2011
Published Date: 04/07/2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
$57
IEC 60749-29 Ed. 1.0 b:2003
IEC 60749-29 Ed. 1.0 b:2003
Published Date: 11/04/2003
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
$33

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