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IEC 60749-29 Ed. 1.0 b:2003 PDF

IEC 60749-29 Ed. 1.0 b:2003 PDF

Name:
IEC 60749-29 Ed. 1.0 b:2003 PDF

Published Date:
11/04/2003

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$33
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Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to latch-up.
Edition : 1.0
File Size : 1 file , 920 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 41
Published : 11/04/2003

History

IEC 60749-29 Ed. 2.0 b:2011
IEC 60749-29 Ed. 2.0 b:2011
Published Date: 04/07/2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
$57
IEC 60749-29 Ed. 1.0 b:2003
IEC 60749-29 Ed. 1.0 b:2003
Published Date: 11/04/2003
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
$33

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