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IEC 60749-33 Ed. 1.0 b:2004 PDF

IEC 60749-33 Ed. 1.0 b:2004 PDF

Name:
IEC 60749-33 Ed. 1.0 b:2004 PDF

Published Date:
03/09/2004

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$15.3
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The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.
Edition : 1.0
File Size : 1 file , 450 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 17
Published : 03/09/2004

History

IEC 60749-33 Ed. 1.0 b:2005
IEC 60749-33 Ed. 1.0 b:2005
Published Date: 11/21/2005
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
$13.8
IEC 60749-33 Ed. 1.0 b:2004
IEC 60749-33 Ed. 1.0 b:2004
Published Date: 03/09/2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
$15.3

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