IEC 60749-35 Ed. 1.0 b:2006 PDF

Name:
IEC 60749-35 Ed. 1.0 b:2006 PDF

Published Date:
07/18/2006

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

Edition :	1.0
File Size :	1 file , 1 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	43
Published :	07/18/2006

History

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