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IEC 60749-35 Ed. 1.0 b:2006 PDF

IEC 60749-35 Ed. 1.0 b:2006 PDF

Name:
IEC 60749-35 Ed. 1.0 b:2006 PDF

Published Date:
07/18/2006

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$57
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Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
Edition : 1.0
File Size : 1 file , 1 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 43
Published : 07/18/2006

History

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