IEC 60749-36 Ed. 1.0 b:2003 PDF

Name:
IEC 60749-36 Ed. 1.0 b:2003 PDF

Published Date:
02/13/2003

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Edition :	1.0
File Size :	1 file , 210 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	7
Published :	02/13/2003

History

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