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IEC 60749-41 Ed. 1.0 b:2020 PDF

IEC 60749-41 Ed. 1.0 b:2020 PDF

Name:
IEC 60749-41 Ed. 1.0 b:2020 PDF

Published Date:
07/22/2020

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$57
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IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
Edition : 1.0
File Size : 1 file , 1.5 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 44
Published : 07/22/2020

History

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