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IEC 60749-27 Ed. 2.0 b:2006 PDF

IEC 60749-27 Ed. 2.0 b:2006 PDF

Name:
IEC 60749-27 Ed. 2.0 b:2006 PDF

Published Date:
07/18/2006

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$28.5
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Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
Edition : 2.0
File Size : 1 file , 530 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 25
Published : 07/18/2006

History

IEC 60749-27 Ed. 2.0 b:2006
IEC 60749-27 Ed. 2.0 b:2006
Published Date: 07/18/2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
$28.5
IEC 60749-27 Ed. 1.0 b:2003
IEC 60749-27 Ed. 1.0 b:2003
Published Date: 10/21/2003
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
$14.7

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