IEC 61649 Ed. 1.0 b:1997 PDF

IEC 61649 Ed. 1.0 b:1997 PDF

Name:
IEC 61649 Ed. 1.0 b:1997 PDF

Published Date:
05/16/1997

Status:
[ Withdrawn ]

Description:

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$23.1
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Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
Edition : 1.0
File Size : 1 file , 150 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 31
Published : 05/16/1997

History

IEC 61649 Ed. 2.0 b:2008
Published Date: 08/13/2008
Weibull analysis
$125.1
IEC 61649 Ed. 1.0 b:1997
Published Date: 05/16/1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
$23.1

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