IEC 61649 Ed. 2.0 b:2008 PDF

IEC 61649 Ed. 2.0 b:2008 PDF

Name:
IEC 61649 Ed. 2.0 b:2008 PDF

Published Date:
08/13/2008

Status:
Active

Description:

Weibull analysis

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$125.1
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IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is applicable whenever data on strength parameters, e.g. times to failure, cycles, stress, etc. are available for a random sample of items operating under test conditions or in-service, for the purpose of estimating measures of reliability performance of the population from which these items were drawn. The main changes with respect to the previous edition are as follows: the title has been shortened and simplified to read "Weibull analysis"; and provision of methods for both analytical and graphical solutions have been added.
Edition : 2.0
File Size : 1 file , 1.8 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 138
Published : 08/13/2008

History

IEC 61649 Ed. 2.0 b:2008
Published Date: 08/13/2008
Weibull analysis
$125.1
IEC 61649 Ed. 1.0 b:1997
Published Date: 05/16/1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
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