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IEC 62276 Ed. 1.0 en:2005 PDF

IEC 62276 Ed. 1.0 en:2005 PDF

Name:
IEC 62276 Ed. 1.0 en:2005 PDF

Published Date:
05/30/2005

Status:
[ Withdrawn ]

Description:

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$51.3
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Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.
Edition : 1.0
File Size : 1 file , 740 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 34
Published : 05/30/2005

History

IEC 62276 Ed. 3.0 b:2016
IEC 62276 Ed. 3.0 b:2016
Published Date: 10/24/2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
$83.4
IEC 62276 Ed. 2.0 b:2012
IEC 62276 Ed. 2.0 b:2012
Published Date: 10/19/2012
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
$83.4
IEC 62276 Ed. 1.0 en:2005
IEC 62276 Ed. 1.0 en:2005
Published Date: 05/30/2005
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
$51.3

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