IEC 62276 Ed. 2.0 b:2012 PDF

IEC 62276 Ed. 2.0 b:2012 PDF

Name:
IEC 62276 Ed. 2.0 b:2012 PDF

Published Date:
10/19/2012

Status:
[ Withdrawn ]

Description:

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$83.4
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IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- terms and definitions are rearranged in accordance with the alphabetical order;
- "reduced LN" is appended to terms and definitions;
- "reduced LT" is appended to terms and definitions;
- reduction process is appended to terms and definitions.
Edition : 2.0
File Size : 1 file , 1 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 82
Published : 10/19/2012

History

IEC 62276 Ed. 3.0 b:2016
Published Date: 10/24/2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
$83.4
IEC 62276 Ed. 2.0 b:2012
Published Date: 10/19/2012
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
$83.4
IEC 62276 Ed. 1.0 en:2005
Published Date: 05/30/2005
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
$51.3

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