IEC 62374-1 Ed. 1.0 b:2010 PDF

Name:
IEC 62374-1 Ed. 1.0 b:2010 PDF

Published Date:
09/29/2010

Status:
Active

Description:

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.

Edition :	1.0
File Size :	1 file , 490 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	32
Published :	09/29/2010

History

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