IEC 62415 Ed. 1.0 b:2010 PDF

IEC 62415 Ed. 1.0 b:2010 PDF

Name:
IEC 62415 Ed. 1.0 b:2010 PDF

Published Date:
05/19/2010

Status:
Active

Description:

Semiconductor devices - Constant current electromigration test

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$15.3
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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Edition : 1.0
File Size : 1 file , 910 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 22
Published : 05/19/2010

History


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