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IEC 62416 Ed. 1.0 b:2010 PDF

IEC 62416 Ed. 1.0 b:2010 PDF

Name:
IEC 62416 Ed. 1.0 b:2010 PDF

Published Date:
04/26/2010

Status:
Active

Description:

Semiconductor devices - Hot carrier test on MOS transistors

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$15.3
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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Edition : 1.0
File Size : 1 file , 890 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 20
Published : 04/26/2010

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