IEC 62416 Ed. 1.0 b:2010 PDF

Name:
IEC 62416 Ed. 1.0 b:2010 PDF

Published Date:
04/26/2010

Status:
Active

Description:

Semiconductor devices - Hot carrier test on MOS transistors

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Edition :	1.0
File Size :	1 file , 890 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	20
Published :	04/26/2010

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