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IEC 62526 Ed. 1.0 en:2007 PDF

IEC 62526 Ed. 1.0 en:2007 PDF

Name:
IEC 62526 Ed. 1.0 en:2007 PDF

Published Date:
11/07/2007

Status:
Active

Description:

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$144.3
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Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Edition : 1.0
File Size : 1 file , 1.5 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 123
Published : 11/07/2007

History

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