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IEC 63287-1 Ed. 1.0 b:2021 PDF

IEC 63287-1 Ed. 1.0 b:2021 PDF

Name:
IEC 63287-1 Ed. 1.0 b:2021 PDF

Published Date:
08/01/2021

Status:
Active

Description:

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$98.7
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This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.

NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.

NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.


Edition : 1.0
File Size : 1 file , 2.7 MB
ISBN(s) : 9782832210172
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 90
Published : 08/01/2021

History

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