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IEEE 1505.1-2008 PDF

IEEE 1505.1-2008 PDF

Name:
IEEE 1505.1-2008 PDF

Published Date:
08/01/2013

Status:
Active

Description:

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$52.2
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New IEEE Standard - Superseded. This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
Edition : 1st
File Size : 1 file , 1.9 MB
ISBN(s) : 9780738158112, 9780738185378, 9780738168579
Note : This product is unavailable in Russia, Belarus
Number of Pages : 170
Product Code(s) : STDSU98313, STDSU95826
Published : 08/01/2013

History

IEEE 1505.1-2019
IEEE 1505.1-2019
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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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IEEE 1505.1-2008
IEEE 1505.1-2008
Published Date: 08/01/2013
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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