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IEEE 1505.1-2019 PDF

IEEE 1505.1-2019 PDF

Name:
IEEE 1505.1-2019 PDF

Published Date:
08/20/2019

Status:
Active

Description:

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$48
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Revision Standard - Active. An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
File Size : 1 file , 9 MB
ISBN(s) : 9781504459754, 9781504461993, 9781504462006, 9781504459761
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 157
Product Code(s) : STD23757, STDRL23757, STDPD23757, STDPDRL23757
Published : 08/20/2019
Redline File Size : 2 files , 28 MB

History

IEEE 1505.1-2019
IEEE 1505.1-2019
Published Date: 08/20/2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
$48
IEEE 1505.1-2008
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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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