IEEE 1620-2004 PDF

IEEE 1620-2004 PDF

Name:
IEEE 1620-2004 PDF

Published Date:
04/29/2004

Status:
Active

Description:

Standard for Test Methods for the Characterization of Organic Transistors and Materials

Publisher:
IEEE

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$42.3
Need Help?
New IEEE Standard - Superseded. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
File Size : 1 file , 140 KB
ISBN(s) : 0738139920, 9780738139937
Note : This product is unavailable in Russia, Belarus
Number of Pages : 20
Product Code(s) : STDSU95219
Published : 04/29/2004

History

IEEE 1620-2008
Published Date: 12/05/2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
$29.1
IEEE 1620-2004
Published Date: 04/29/2004
Standard for Test Methods for the Characterization of Organic Transistors and Materials
$42.3

Related products

IEEE 1394-2008
Published Date: 10/21/2008
IEEE Standard for a High-Performance Serial Bus
$139.2
IEEE 1386-2001
Published Date: 08/21/2001
IEEE Standard for a Common Mezzanine Card Family: CMC
$51.6
IEEE 1394.1-2004
Published Date: 07/01/2005
IEEE Standard for High Performance Serial Bus Bridges
$40.2

Best-Selling Products

Process Plant Commissioning : A User Guide
Published Date: 01/01/1990
$25.146