IEEE 1620-2008 PDF

IEEE 1620-2008 PDF

Name:
IEEE 1620-2008 PDF

Published Date:
12/05/2008

Status:
Active

Description:

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

Publisher:
IEEE

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$29.1
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Revision Standard - Inactive-Reserved. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.
File Size : 1 file , 750 KB
ISBN(s) : 9780738160139, 9780738169514, 9781504469333
Note : This product is unavailable in Russia, Belarus
Number of Pages : 26
Product Code(s) : STDSURL95827, STDRES95827
Published : 12/05/2008
Redline File Size : 2 files , 1.9 MB

History

IEEE 1620-2008
Published Date: 12/05/2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
$29.1
IEEE 1620-2004
Published Date: 04/29/2004
Standard for Test Methods for the Characterization of Organic Transistors and Materials
$42.3

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