New IEEE Standard - Active - Draft.
This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified, and dozens of commonly used terms are clearly defined, to aid communication about the quality of tested ICs
| File Size : | 1
file
, 4.2 MB |
| ISBN(s) : | 9798855714104 |
| Note : | This product is unavailable in Russia, Belarus |
| Number of Pages : | 93 |
| Product Code(s) : | STDUD27451 |
