Low prices! Originals & Translations! Save your budget and time!
ONLINENORMS: Online Standards Store
Click View Shopping Cart
  1. Home
  2. IEEE
  3. IEEE 1687-2014 PDF

IEEE 1687-2014 PDF

IEEE 1687-2014 PDF

Name:
IEEE 1687-2014 PDF

Published Date:
12/05/2014

Status:
Active

Description:

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$84.9
Need Help?
New IEEE Standard - Active. A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.
File Size : 1 file , 8 MB
ISBN(s) : 9781504416832, 9780738194165, 9780738194172
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 266
Product Code(s) : STD20033, STDPD20033, STDPL20033
Published : 12/05/2014

History

Related products

IEEE 1149.1-2013
IEEE 1149.1-2013
Published Date: 05/13/2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
$95.4
IEEE 1500-2022
IEEE 1500-2022
Published Date: 10/12/2022
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
$49.5
IEEE 1838-2019
IEEE 1838-2019
Published Date: 03/13/2020
IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
$31.2

Best-Selling Products

An Investigator's Guide to Tire Failures
An Investigator's Guide to Tire Failures
Published Date: 01/01/1987
$7.5