BS ISO 17331:2004+A1:2010 PDF

Published Date: 09/30/2010

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

Published Date: 03/31/2005

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

Published Date: 12/01/2019

Accuracy (trueness and precision) of measurement methods and results - Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method

Published Date: 08/01/2014

Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Published Date: 11/01/2017

Information technology — Learning, education and training — Metadata for learning resources — Part 11: Migration from LOM to MLR

Published Date: 05/27/2014

Information technology — Service management — Part 10: Concepts and terminology

Published Date: 02/01/2016

Information technology — Service management — Part 10: Concepts and terminology

Published Date: 05/27/2014

Information technology — Service management — Part 4: Process reference model

Published Date: 05/27/2014

Information technology - Service management - Part 5: Exemplar implementation plan for ISO/IEC 20000-1

Published Date: 03/01/2015

Information technology — Service management — Part 9: Guidance on the application of ISO/IEC 20000-1 to cloud services