Name:
ISO 12179:2000 PDF
Published Date:
03/15/2000
Status:
Active
This International Standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards.
Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.
| File Size : | 1 file , 190 KB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 17 |
| Published : | 03/15/2000 |
| Same As : | ISO 12179:2000 |