Low prices! Originals & Translations! Save your budget and time!
ONLINENORMS: Online Standards Store
Click View Shopping Cart
  1. Home
  2. ISO
  3. ISO 13084:2011 PDF

ISO 13084:2011 PDF

ISO 13084:2011 PDF

Name:
ISO 13084:2011 PDF

Published Date:
05/15/2011

Status:
Active

Description:

Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Publisher:
International Organization for Standardization

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$20.4
Need Help?

ISO 13084:2011 specifies a method to optimize the mass calibration accuracy in time-of-flight SIMS instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.


File Size : 1 file , 300 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Published : 05/15/2011
Same As : ISO 13084:2011

History

ISO 13084:2018
ISO 13084:2018
Published Date: 11/01/2018
Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
$37.2
ISO 13084:2011
ISO 13084:2011
Published Date: 05/15/2011
Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
$20.4

Related products

ISO 6685:1982
ISO 6685:1982
Published Date: 07/01/1982
Chemical products for industrial use -- General method for determination of iron content -- 1,10-Phenanthroline spectrophotometric method
$15.3
ISO 29081:2010
ISO 29081:2010
Published Date: 02/15/2010
Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
$49.8
ISO 15472:2010
ISO 15472:2010
Published Date: 05/01/2010
Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
$58.2
ISO 11505:2012
ISO 11505:2012
Published Date: 12/15/2012
Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
$58.2

Best-Selling Products

IEEE/ASTM SI 10-2002
IEEE/ASTM SI 10-2002
Published Date: 12/30/2002
IEEE/ASTM Standard for Use of the International System of Units (SI): The Modern Metric System
$23.7
IEEE/ASTM SI_10-2010
IEEE/ASTM SI_10-2010
Published Date: 04/11/2011
American National Standard for Metric Practice
$32.7