ISO 13084:2018 PDF

ISO 13084:2018 PDF

Name:
ISO 13084:2018 PDF

Published Date:
11/01/2018

Status:
Active

Description:

Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Publisher:
International Organization for Standardization

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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This document specifies a method to optimize the mass calibration accuracy in time-of-flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.


Edition : 2nd
File Size : 1 file , 1.7 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 22
Published : 11/01/2018
Same As : ISO 13084:2018

History

ISO 13084:2018
Published Date: 11/01/2018
Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
$37.2
ISO 13084:2011
Published Date: 05/15/2011
Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
$20.4

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