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ISO 13424:2013 PDF

ISO 13424:2013 PDF

Name:
ISO 13424:2013 PDF

Published Date:
10/01/2013

Status:
Active

Description:

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis

Publisher:
International Organization for Standardization

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$66.9
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ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.


File Size : 1 file , 2.2 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Published : 10/01/2013
Same As : ISO 13424:2013

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