ISO 8503-3:1988 PDF

ISO 8503-3:1988 PDF

Name:
ISO 8503-3:1988 PDF

Published Date:
02/01/1988

Status:
Active

Description:

Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 3: Method for the calibration of ISO surface profile comparators and for the determination of surface profile - Focusing microscope procedure

Publisher:
International Organization for Standardization

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$19.8
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Based on observation of the test surface over a specified field of view, focussing the highest peaks and lowest valleys by movement of the objective. Determination of the distance (peak-to-valley height) between the highest peak and lowest valley by movement of the objective in order to focus on the lowest valley within the same field of view. Repetition of the procedure to obtain values for a further 19 different fields of view, calculation of the arithmetic mean. The focussing microscope is also specified. The procedure is also applicable to the determination of the surface profile of essentially planar blast-cleaned steel.


File Size : 1 file , 640 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 8
Published : 02/01/1988
Same As : ISO 8503-3:1988

History

ISO 8503-3:2012
Published Date: 02/15/2012
Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 3: Method for the calibration of ISO surface profile comparators and for the determination of surface profile - Focusing microscope procedure
$24.3
ISO 8503-3:1988
Published Date: 02/01/1988
Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 3: Method for the calibration of ISO surface profile comparators and for the determination of surface profile - Focusing microscope procedure
$19.8

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