Name:
ISO 9220:1988 PDF
Published Date:
10/01/1988
Status:
Active
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.
| File Size : | 1 file , 460 KB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 5 |
| Published : | 10/01/1988 |
| Same As : | ISO 9220:1988 |
