JEDEC JEP 122E PDF

JEDEC JEP 122E PDF

Name:
JEDEC JEP 122E PDF

Published Date:
03/01/2009

Status:
Active

Description:

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

Publisher:
JEDEC Solid State Technology Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum of the Failure Rates method.

File Size :	1 file , 1.7 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	94
Published :	03/01/2009

History

Published Date: 10/01/2011

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

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Published Date: 11/01/2010

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

$42.3

Published Date: 03/01/2009

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

$42.3

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