JEDEC JEP118 PDF

JEDEC JEP118 PDF

Name:
JEDEC JEP118 PDF

Published Date:
01/01/1993

Status:
Active

Description:

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$18
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These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation.
File Size : 1 file , 570 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 20
Published : 01/01/1993

History

JEDEC JEP118
Published Date: 12/01/2018
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
$21.6
JEDEC JEP118
Published Date: 01/01/1993
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
$18

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