JEDEC JEP118 PDF

JEDEC JEP118 PDF

Name:
JEDEC JEP118 PDF

Published Date:
12/01/2018

Status:
Active

Description:

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$21.6
Need Help?
These guidelines apply to GaAs Monolithic Microwave Integrated Circuits (MMICs) and their individual component building blocks, such as GaAs Metal-Semiconductor Field Effect Transistors (MESFETs), Pseudomorphic High Electron Mobility Transistors (PHEMTs), Heterojunction Bipolar Transistors (HBTs), resistors, and capacitors. While the procedure described in this document may be applied to other semiconductor technologies, especially those used in RF and microwave frequency analog applications, it is primarily intended for technologies based on GaAs and related III-V material systems (InP, AlGaAs, InGaAs, InGaP, GaN, etc).
File Size : 1 file , 420 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 28
Published : 12/01/2018

History

JEDEC JEP118
Published Date: 12/01/2018
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
$21.6
JEDEC JEP118
Published Date: 01/01/1993
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
$18

Related products

JEDEC JEP110
Published Date: 07/01/1988
GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS
$16.2
JEDEC JEP118
Published Date: 12/01/2018
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
$21.6
JEDEC JES 2
Published Date: 07/01/1992
TRANSISTOR, GALLIUM ARSENIDE POWER FET, GENERIC SPECIFICATION
$27.3
JEDEC JESD 1
Published Date: 04/01/1982
LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARS
$15.9

Best-Selling Products

HIMSS/NEMA HN 1-2008
Published Date:
Manufacturer Disclosure Statement for Medical Device Security
HIMSS/NEMA HN 1-2013
Published Date: 11/01/2013
Manufacturer Disclosure Statement for Medical Device Security
Free Download