JEDEC JEP194 PDF

Name:
JEDEC JEP194 PDF

Published Date:
02/01/2023

Status:
Active

Description:

Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs

Publisher:
JEDEC Solid State Technology Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This document provides guidelines for evaluating gate reliability and lifetime testing for silicon carbide (SiC) based power devices with a gate oxide or gate dielectric.

File Size :	1 file , 670 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	30
Published :	02/01/2023

History

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