Name:
JEDEC JEP194 PDF
Published Date:
02/01/2023
Status:
Active
Publisher:
JEDEC Solid State Technology Association
This document provides guidelines for evaluating gate reliability and lifetime testing for silicon carbide (SiC) based power devices with a gate oxide or gate dielectric.
| File Size : | 1 file , 670 KB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 30 |
| Published : | 02/01/2023 |
