JEDEC JEP199 PDF

JEDEC JEP199 PDF

Name:
JEDEC JEP199 PDF

Published Date:
04/01/2024

Status:
Active

Description:

Procedure for Reliability Characterization of Metal-Insulator-Metal Capacitors

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$Free Download
Need Help?

This publication provides a complete framework and defines the standards for achieving Reliability certification and qualification of on-chip MIM capacitors or Trench capacitors (MIS Capacitor). The test methods and Merit definitions comprehend the full gamut of products across all market segments with respect to use condition and EOL targets. The scope covers all applications of MIMCAP, such as de-coupling capacitor and signal capacitance usage.


File Size : 1 file , 840 KB
Note : This product is unavailable in Russia, Belarus
Number of Pages : 24
Published : 04/01/2024

History


Related products

JEDEC JEP155B (R2024)
Published Date: 07/01/2018
RECOMMENDED ESD TARGET LEVELS FOR HBM QUALIFICATION
$27.3
JEDEC JESD22-B118A
Published Date: 11/01/2021
Semiconductor Wafer and Die Backside External Visual Inspection
$18.6
JEDEC JESD217A
Published Date: 11/01/2022
Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages
Free Download

Best-Selling Products