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JEDEC JESD 22-A117B PDF

JEDEC JESD 22-A117B PDF

Name:
JEDEC JESD 22-A117B PDF

Published Date:
03/01/2009

Status:
Active

Description:

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$18.6
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This method establishes a standard procedure for determining the data cycling endurance and data retention capability of non-volatile memory cells. It is intended as a qualification and monitor test procedure. This test is also applicable to FLASH EEPROM integrated circuits and Erasable Programmable Logic Devices (EPLD) with embedded EEPROM or FLASH memory.
File Size : 1 file , 170 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 22
Published : 03/01/2009

History

JEDEC JESD22-A117E
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JEDEC JESD22-A117D
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JEDEC JESD22-A117C
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ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
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JEDEC JESD 22-A117B
JEDEC JESD 22-A117B
Published Date: 03/01/2009
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
$18.6

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