JEDEC JESD74A PDF

JEDEC JESD74A PDF

Name:
JEDEC JESD74A PDF

Published Date:
02/01/2007

Status:
Active

Description:

EARLY LIFE FAILURE RATE CALCULATION PROCEDURE FOR SEMICONDUCTOR COMPONENTS

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$23.4
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This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements.
File Size : 1 file , 300 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 37
Published : 02/01/2007

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