JEDEC JESD 435 (R2009) PDF

JEDEC JESD 435 (R2009) PDF

Name:
JEDEC JESD 435 (R2009) PDF

Published Date:
04/01/1976

Status:
Active

Description:

STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$18.6
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This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435
File Size : 1 file , 620 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 23
Published : 04/01/1976

History


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