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JEDEC JESD22-B121 PDF

JEDEC JESD22-B121 PDF

Name:
JEDEC JESD22-B121 PDF

Published Date:
11/01/2023

Status:
Active

Description:

Test Method for Total Ionizing Dose (TID) from X-ray Exposure in Terrestrial Applications

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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This test procedure covers X-ray imaging for terrestrial applications on packaged devices but does not exclude the option to characterize on bare die or wafers as long as potential dose absorption or amplification effects are considered in the final assessment.

Terrestrial X-ray-imaging techniques are suitable for finding hidden defects in buried structures within Integrated Circuit (IC) packages. These techniques are complementary to the optical inspection techniques used to find surface defects.

The X-ray system targeted for semiconductor product inspection can be used to replicate total cumulative dose for any X-ray exposure system (e.g., scanner imaging during shipping with IC devices inside, solder-joint inspection, and returned-material analysis) for characterization of dose effects.


File Size : 1 file , 390 KB
Note : This product is unavailable in Russia, Belarus
Number of Pages : 26
Published : 11/01/2023

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