Name:
JEDEC JESD91B PDF
Published Date:
03/01/2022
Status:
Active
Publisher:
JEDEC Solid State Technology Association
The method described in this document applies to all reliability mechanisms associated with electronic devices.
The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.
| File Size : | 1 file , 370 KB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 20 |
| Published : | 03/01/2022 |
