MIL MIL-PRF-19500/702B PDF

Published Date: 06/24/2016

Transistor, Field Effect, N-Channel, Radiation Hardened, Silicon, Encapsulated (Through Hole Package), Types 2N7482, 2N7483, and 2N7484, JANTXVR, F, G, and H and JANSR, F, G, and H

Published Date: 02/26/2014

Transistor, Field Effect, N-Channel, Radiation Hardened, Silicon, Encapsulated (Through Hole Package), Types 2N7482, 2N7483, and 2N7484, JANTXVR, F, G, and H and JANSR, F, G, and H

Published Date: 05/21/2010

Transistor, Field Effect, N-Channel, Radiation Hardened, Silicon, Encapsulated (Through Hole Package), Types 2N7482, 2N7483, and 2N7484, JANTXVR, F, G, and H and JANSR, F, G, and H

Published Date: 05/30/2007

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, N-CHANNEL, SILICON, TYPES 2N7482T3, 2N7483T3, AND 2N7484T3, JANTXVR, F, G, AND H AND JANSR, F, G, AND H(SUPERSEDING MIL-PRF-19500/702C)

Published Date: 01/18/2005

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED(TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, N-CHANNEL, SILICON, TYPES 2N7482T3, 2N7483T3, AND 2N7484T3, JANTXVR, F, G, AND H AND JANSR, F, G, AND H (SUPERSEDING MIL-PRF-19500/702)

Published Date: 11/28/2001

SEMICONDUCTOR DEVICE FIELD EFFECT RADIATION HARDENED TOTAL DOSE & SINGLE EVENT EFFECTS TRANSISTOR N-CHANNEL SILICON TYPES 2N7482T3 - 2N7484T3 JANTXVR F G & H JANSR F G & H (S/S BY MIL-PRF-19500/702A)

Published Date: 03/27/2019

Transistor, PNP, Silicon, Switching, Types 2N2906A, 2N2907A, JAN, JANTX, JANTXV, JANS, JANHC, JANKC

Published Date: 03/06/2015

Diode, Silicon,Schottky Barrier, Fast Recovery, Type 1N6392, JAN, JANTX, JANTXV, and JANHC

Published Date: 05/09/2005

SEMICONDUCTOR DEVICE, DIODE, NON-HERMETIC, EPOXY, SURFACE MOUNT, SILICON, BIDIRECTIONAL TRANSIENT VOLTAGE SUPPRESSOR, TYPES 1N6036AUEG THROUGH 1N6072AUEG, 1N6036AUEJ THROUGH 1N6072AUEJ, JAN, JANTX, AND JANTXV

Published Date: 07/01/1996

MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES

Published Date: 03/01/1966

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

Published Date: 11/01/1969

PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE

Published Date: 07/01/1980

ADDENDUM No. 1 TO EIA-397

Published Date: 06/01/1972

RECOMMENDED STANDARD FOR THYRISTORS

Published Date: 02/01/2006

STATISTICAL PROCESS CONTROL SYSTEMS