MIL MIL-S-19500/356D PDF

Published Date: 07/27/2019

Semiconductor Device, Diode, Silicon, Voltage Regulator, Types 1N4954 through 1N4996, 1N5968, 1N5969,and 1N6632 through 1N6637, 1N4954US through 1N4996US, 1N5968US, 1N5969US, and 1N6632US through 1N6637US, and C and D Tolerance Suffix Devices, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 06/27/2014

Semiconductor Device, Diode, Silicon, Voltage Regulator, Types 1N4954 through 1N4996, 1N5968, 1N5969,and 1N6632 through 1N6637, 1N4954US through 1N4996US, 1N5968US, 1N5969US, and 1N6632US through 1N6637US, and C and D Tolerance Suffix Devices, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 02/08/2013

Semiconductor Device, Diode, Silicon, Voltage Regulator, Types 1N4954 through 1N4996, 1N5968, 1N5969,and 1N6632 through 1N6637, 1N4954US through 1N4996US, 1N5968US, 1N5969US, and 1N6632US through 1N6637US, and C and D Tolerance Suffix Devices, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 02/01/2006

SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR, TYPES 1N4954 THROUGH 1N4996, 1N5968, 1N5969, AND 1N6632 THROUGH 1N6637, 1N4954US THROUGH 1N4996US, 1N5968US, 1N5969US, AND 1N6632US THROUGH 1N6637US, AND C AND D TOLERANCE SUFFIX DEVICES, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC(SUPERSEDING

Published Date: 11/24/2004

SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR, TYPES 1N4954 THROUGH 1N4996, 1N5968, 1N5969, AND 1N6632 THROUGH 1N6637, 1N4954US THROUGH 1N4996US, 1N5968US, 1N5969US, AND 1N6632US THROUGH 1N6637US, AND C AND D TOLERANCE SUFFIX DEVICES, JAN, JANTX (SUPERSEDING MIL-PRF-19500/356G)(S/S BY MIL-

Published Date: 09/05/2003

SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR, TYPES 1N4954 THROUGH 1N4996, 1N5968, 1N5969, AND 1N6632 THROUGH 1N6637, 1N4954US THROUGH 1N4996US, 1N5968US, 1N5969US, AND 1N6632US THROUGH 1N6637US, AND C AND D TOLERANCE SUFFIX DEVICES, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC (SUPERSEDING

Published Date: 08/30/1999

SEMI DEVICE DIODE SILICON VOLT REG TYPES 1N4954-1N4996 1N5968 1N5969 1N6632-1N6637 1N4954US-1N4996US 1N5968US 1N5969US-1N6632US-1N6637US C&D TOL SUF DEVICES (SUPERSEDING MIL-S-19500/356E) (S/S BY MIL-PRF-19500/356G)

Published Date: 11/11/1996

SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULARTOR TYPES 1N4954 THROUGH 1N4996, 1N5968, 1N5969, AND 1N6632 THROUGH 1N6637, 1N4954US THROUGH 1N4996US, 1N5968US, 1N5969US, AND 1N6632US THROUGH 1N6637US AND C AND D TOLERANCE SUFFIX DEVICES JAN, JANTX, JANS, JANHC, AND JANKC (SUPERSEDING MIL-S-195

Published Date: 06/19/1992

SEMICONDUCTOR DEV,DIODE,SILICON,VOLTAGE REG TYPES 1N4954-1N4996,1N5968,1N5969&1N6632-1N6637,1N4954US THROUGH 1N4996US, 1N5968US,1N5969US, AND 1N6632US-1N6637US JANTX, JANTXV, JANS AND JANC (SUPERSEDING MIL-S-19500/356C)(S/S BY MIL-PRF-19500/356E)

Published Date: 09/10/2001

SEMICONDUCTOR DEVICE, PIN DIODE, SILICON, TYPE 1N5719(SUPERSEDING DSCC 01038 AND MIL-PRF-19500/443B)

Published Date: 02/25/2014

Semiconductor Device, Diode, Silicon, Schottky Barrier, Fast Recovery, Type 1N6391, JAN, JANTX, JANTXV, JANS, and JANHC

Published Date: 12/06/2013

Semiconductor Device, Field Effect Radiation Hardened Transistor, P-Channel Silicon, Types 2N7424, 2N7425, and 2N7426, JANTXVR, JANTXVF, JANSR, and JANSF

Published Date: 04/05/1993

SEMICONDUCTOR DEVICE, DARLINGTON TRANSISTOR, NPN, SILICON, HIGH-POWER TYPE 2N7370 JANTX, JANTXV, AND JANS(S/S BY MIL-DTL-19500/624A)

Published Date: 01/11/2017

Walkway Surface Auditing Procedure for the Measurement of Walkway Slip Resistance

Published Date: 03/12/2021

Walkway Surface Auditing Procedure for the Measurement of Walkway Slip Resistance

Published Date: 10/13/2009

Test Method for Measuring Wet SCOF of Common Hard-Surface Floor Materials

Published Date: 2020

Test Method for Measuring Wet SCOF of Common Hard-Surface Floor Materials

Published Date: 2020

Test Method for Determining the Impact on Wet Coefficients of Friction of Various Chemical or Physical Walkway Surface Cleaners and Treatments on Common Hard-Surface Flooring Materials

Published Date: 01/18/2012

Test Method for Measuring Wet DCOF of Common Hard-Surface Floor Materials