ASTM F390-98 PDF

ASTM F390-98 PDF

Name:
ASTM F390-98 PDF

Published Date:
05/10/1998

Status:
Active

Description:

Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array

Publisher:
ASTM International

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$16.2
Need Help?

1.1 This test method covers the measurement of the sheet resistance of metallic thin films with a collinear four-probe array. It is intended for use with rectangular metallic films between 0.01 and 100 [mu]m thick, formed by deposition of a material or by a thinning process and supported by an insulating substrate, in the sheet resistance range from 10 to 10 [omega]/[open-box] (see 3.1.3).

1.2 This test method is suitable for referee measurement purposes as well as for routine acceptance measurements.

1.3 The values stated in Si units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


File Size : 1 file , 68 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 4
Published : 05/10/1998

History

ASTM F390-11
Published Date: 06/01/2011
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array (Withdrawn 2020)
$15.6
ASTM F390-98(2003)
Published Date: 01/01/2003
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
$15
ASTM F390-98
Published Date: 05/10/1998
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
$16.2

Related products

ASTM F615M-95(2013)
Published Date: 05/01/2013
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)
$19.2
ASTM F523-02
Published Date: 12/10/2002
Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces (Withdrawn 2003)
$17.4

Best-Selling Products

Clark on Surveying & Boundaries
Published Date: 01/01/1997
$28.5