BS 12/30235353 DC PDF

BS 12/30235353 DC PDF

Name:
BS 12/30235353 DC PDF

Published Date:
01/30/2012

Status:
Active

Description:

BS ISO 16413. Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

Publisher:
BSI Group

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
Need Help?


All current amendments available at time of purchase are included with the purchase of this document.
Number of Pages : 34
Published : 01/30/2012

History

BS ISO 16413:2020
Published Date: 08/18/2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
$92.964
BS ISO 16413:2013
Published Date: 03/31/2013
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
$92.964
BS 12/30235353 DC
Published Date: 01/30/2012
BS ISO 16413. Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

Related products

BS ISO 19107:2003
Published Date: 06/27/2003
Geographic information. Spatial schema
$73.152
BS EN ISO 19157:2013
Published Date: 12/31/2013
Geographic information. Data quality
$121.158
BS ISO 19128:2005
Published Date: 02/27/2004
Geographic information. Web map server interface
$68.58

Best-Selling Products

NAIMA AH116
Published Date: 06/01/2002
FIBROUS GLASS DUCT CONSTRUCTION STANDARDS LOW VELOCITY SYSTEMS 2" w.g. (500 Pa) Maximum Static Pressure
$20.7