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BS ISO 16413:2013 PDF

BS ISO 16413:2013 PDF

Name:
BS ISO 16413:2013 PDF

Published Date:
03/31/2013

Status:
Active

Description:

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

Publisher:
British Standard / International Organization for Standardization

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$92.964
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Cross References:
ISO/IEC Guide 98-3
ISO 25178-2


All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 2.1 MB
ISBN(s) : 9780580730160
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 42
Product Code(s) : 30235354, 30235354, 30235354
Published : 03/31/2013
Same As : BS ISO 16413:2013

History

BS ISO 16413:2020
BS ISO 16413:2020
Published Date: 08/18/2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
$92.964
BS ISO 16413:2013
BS ISO 16413:2013
Published Date: 03/31/2013
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
$92.964
BS 12/30235353 DC
BS 12/30235353 DC
Published Date: 01/30/2012
BS ISO 16413. Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

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