BS ISO 16413:2020 PDF

BS ISO 16413:2020 PDF

Name:
BS ISO 16413:2020 PDF

Published Date:
08/18/2020

Status:
Active

Description:

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

Publisher:
British Standard / International Organization for Standardization

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$92.964
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This document specifies a method for the evaluation of thickness, density and interface width of single layer and multi-layered thin films which have thicknesses between approximately 1 nm and 1 µm, on flat substrates, by means of X-Ray Reflectometry (XRR).

All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 3.7 MB
ISBN(s) : 9780539016529
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 42
Product Code(s) : 30380296, 30380296, 30380296
Published : 08/18/2020

History

BS ISO 16413:2020
Published Date: 08/18/2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
$92.964
BS ISO 16413:2013
Published Date: 03/31/2013
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
$92.964
BS 12/30235353 DC
Published Date: 01/30/2012
BS ISO 16413. Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

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