BS ISO 25498:2010 PDF

Name:
BS ISO 25498:2010 PDF

Published Date:
06/30/2010

Status:
Active

Description:

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

Publisher:
British Standard / International Organization for Standardization

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
ISO/IEC 17025
ASTM E 3-2001

All current amendments available at time of purchase are included with the purchase of this document.

File Size :	1 file , 3.2 MB
ISBN(s) :	9780580578533
Note :	This product is unavailable in Russia, Ukraine, Belarus
Number of Pages :	40
Product Code(s) :	30157805, 30157805, 30157805
Published :	06/30/2010
Same As :	BS ISO 25498:2010

History

BS ISO 25498:2018

Published Date: 03/23/2018

Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

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BS ISO 25498:2010

Published Date: 06/30/2010

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

$92.964

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