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BS ISO 25498:2010 PDF

BS ISO 25498:2010 PDF

Name:
BS ISO 25498:2010 PDF

Published Date:
06/30/2010

Status:
Active

Description:

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

Publisher:
British Standard / International Organization for Standardization

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$92.964
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Cross References:
ISO/IEC 17025
ASTM E 3-2001


All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 3.2 MB
ISBN(s) : 9780580578533
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 40
Product Code(s) : 30157805, 30157805, 30157805
Published : 06/30/2010
Same As : BS ISO 25498:2010

History

BS ISO 25498:2018
BS ISO 25498:2018
Published Date: 03/23/2018
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
$105.156
BS ISO 25498:2010
BS ISO 25498:2010
Published Date: 06/30/2010
Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
$92.964

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