BS ISO 25498:2018 specifies the method of selected area electron diffraction (SAED) analysis using a
transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies
to test areas of micrometres and sub-micrometres in size. The minimum diameter of the selected area
in a specimen which can be analysed by this method is restricted by the spherical aberration coefficient
of the objective lens of the microscope and approaches several hundred nanometres for a modern TEM.
When the size of an analysed specimen area is smaller than that restriction, this document can also
be used for the analysis procedure. But, because of the effect of spherical aberration, some of the
diffraction information in the pattern can be generated from outside of the area defined by the selected
area aperture. In such cases, the use of microdiffraction (nano-beam diffraction) or convergent beam
electron diffraction, where available, might be preferred.
This document is applicable to the acquisition of SAED patterns from crystalline specimens, indexing
the patterns and calibration of the diffraction constant.
Cross References:ISO/IEC 17025
ISO 15932:2013 ED1
ASTM E 3-11
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 2.5 MB |
| ISBN(s) : | 9780580946929 |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 46 |
| Product Code(s) : | 30343629, 30343629, 30343629 |
| Published : | 03/23/2018 |
| Same As : | BS ISO 25498:2018 |
