Semiconductor devices - Micro-electromechanical devices Part 4: Generic specification for MEMS
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Semiconductor devices - Micro-electromechanical devices Part 5: RF MEMS switches
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Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
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Semiconductor devices - Micro-electromechanical devices Part 8: Strip bending test method for tensile property measurement of thin films
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Semiconductor devices - Micro-electromechanical devices Part 9: Wafer to wafer bonding strength measurement for MEMS
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Electricity metering equipment (AC) - General requirements, tests and test conditions Part 11: Metering equipment
Document status: [ Revised ]
Apparati per la misura dell'energia elettrica (c.a.) - Prescrizioni generali, prove e condizioni di prova Parte 11: Apparato di misura
Document status: [ Revised ]
Electricity metering equipment (AC) - General requirements, tests and test conditions Part 11: Metering equipment
Document status: [ Revised ]
Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 11: Metering equipment
Document status: [ Revised ]
Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 11: Metering equipment
Document status: [ Revised ]
